Download e-book for iPad: Atomic Force Microscopy Based Nanorobotics: Modelling, by Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti

By Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti

ISBN-10: 3642203280

ISBN-13: 9783642203282

ISBN-10: 3642203299

ISBN-13: 9783642203299

The atomic strength microscope (AFM) has been effectively used to accomplish nanorobotic manipulation operations on nanoscale entities resembling debris, nanotubes, nanowires, nanocrystals, and DNA due to the fact that Nineteen Nineties.

There were many development on modeling, imaging, teleoperated or automatic regulate, human-machine interfacing, instrumentation, and purposes of AFM dependent nanorobotic manipulation structures in literature. This ebook goals to incorporate all of such cutting-edge growth in an equipped, based, and distinct demeanour as a reference e-book and likewise very likely a textbook in nanorobotics and the other nanoscale dynamics, platforms and controls comparable learn and schooling.

Clearly written and well-organized, this article introduces designs and prototypes of the nanorobotic platforms intimately with leading edge rules of three-d manipulation strength microscopy and parallel imaging/manipulation strength microscopy.

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Extra resources for Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

Sample text

The next step is the force calibration of the piezoresistive sensor. The piezoresistive cantilever was mounted horizontally on a 3 DOF platform, so the force applied on the cantilever was normal to its longitudinal axis. 8nm, which was used for the displacement increments during the calibration. On the surface of the glass substrate, a glass microsphere with a diameter of 50µm was glued near the substrate edge used for the point of contact with the piezoresistive cantilever during the force loading.

Moreover, lack of real-time visual feedback makes the “blind” manipulation process very difficult to control and then local image scan are frequently required to relocate nanoobjects when manipulation lost. It is obvious that repeatedly image scans make the manipulation process fairly lengthy. Fig. 7 A serial procedure of conventional AFM based nanomanipulation. In order to conquer limitations above-mentioned on visual feedback and facilitate nanomanipulation, haptic devices and virtual reality interfaces have been introduced into AFM-based nanomanipulation systems 13, 14, thereby enabling an operator to directly interact with the real nano-world.

96, 123109 (2010) 16 31. : Three-dimensional manipulation of gold nanoparticles with electro-enhanced capillary forces. Appl. Phys. Lett. 96, 043117 (2010) 16 32. : A versatile atomic force microscope for threedimensional nanomanipulation and nanoassembly. Nanotechnology 20, 215301 (2009) 16, 20 33. : Teleoperated touch feedback from the surfaces at the nanoscale: Modeling and experiments. IEEE/ASME Trans. Mechatron. 8, 287–298 (2003) 17 34. : Development of augmented reality system for afm-based nanomanipulation.

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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments by Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti


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